A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning over it with a high energy focused beam of electrons. The electrons interact with electrons in the sample, producing secondary electrons, back-scattered electrons, and characteristic X-rays that can be detected and that contain information about the sample’s surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam’s position is combined with the detected signal to produce an image.

We are taking the freedom to show a few images we found through the web, all the rights are of course reserved to their producers and authors, we cared to declare the source of each image but if anybody feels offended by our treatment of intellectual property please do not hesitate and contact us. We can easily arrange a more precise quote or immediately remove the content, if no other solution is feasible.
This post was written with the single aim of showing a cool thing that happens in the world, there are no commercial purposes nor attemps to steal intellectual property.










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